title: Method for determining optical constants and the thickness of the thin film
metadata.name: dc.contributor.author
metadata.value: Karpov, Andrey Gennadievich
metadata.lang: -
metadata.name: dc.contributor.author
metadata.value: Klemeshev, Vladimir Alekseevich
metadata.lang: -
metadata.name: dc.date.accessioned
metadata.value: 2017-05-18T12:15:07Z
metadata.lang: -
metadata.name: dc.date.available
metadata.value: 2017-05-18T12:15:07Z
metadata.lang: -
metadata.name: dc.date.issued
metadata.value: 2017-03
metadata.lang: -
metadata.name: dc.identifier.citation
metadata.value: Karpov A. G., Klemeshev V. A. Method for determining optical constants and the thickness of the thin film. Vestnik of Saint Petersburg University. Applied mathematics. Computer science. Control processes, 2017, volume 13, issue 1, pp. 17–26.
metadata.lang: en_GB
metadata.name: dc.identifier.other
metadata.value: 10.21638/11701/spbu10.2017.102
metadata.lang: -
metadata.name: dc.identifier.uri
metadata.value: http://hdl.handle.net/11701/6349
metadata.lang: -
metadata.name: dc.description.abstract
metadata.value: Here are presented the results of the development and application of methods for determining
  the optical constants and thickness of thin films. The generalized target model function is
  formed to determine the unmeasured parameters. The model is applied by using the least
  squares method and the steepest descent. Increased efficiency is achieved by using a three-step
  processing algorithm. The proposed method was applied to calculate the characteristics of the
  multi-alkali photocathode, which is a complex compound having in its composition antimonides
  of potassium, sodium and cesium. A comparison of the calculation results with the data given
  in the literature is presented. Refs 11. Figs 4.
metadata.lang: en_GB
metadata.name: dc.language.iso
metadata.value: en
metadata.lang: en_GB
metadata.name: dc.publisher
metadata.value: St Petersburg State University
metadata.lang: en_GB
metadata.name: dc.relation.ispartofseries
metadata.value: Vestnik of St Petersburg University. Applied Mathematics. Computer Science. Control Processes;Volume 13; Issue 1
metadata.lang: -
metadata.name: dc.subject
metadata.value: thin film
metadata.lang: en_GB
metadata.name: dc.subject
metadata.value: optical constants
metadata.lang: en_GB
metadata.name: dc.subject
metadata.value: the thickness of the thin film
metadata.lang: en_GB
metadata.name: dc.subject
metadata.value: the generalized target model function
metadata.lang: en_GB
metadata.name: dc.subject
metadata.value: the data processing algorithm
metadata.lang: en_GB
metadata.name: dc.title
metadata.value: Method for determining optical constants and the thickness of the thin film
metadata.lang: en_GB
metadata.name: dc.type
metadata.value: Article
metadata.lang: en_GB
resources.filename: 02-Karpov.pdf
resources.url: https://dspace.spbu.ru/bitstream/11701/6349/1/02-Karpov.pdf
resources.format: Adobe PDF
resources.size: 400,93 kB